SN74BCT8240ANT

制造商零件编号
SN74BCT8240ANT
制造商
Rochester Electronics, LLC
包装/箱
-
数据表
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描述
IC SCAN TEST DEVICE BUFF 24-DIP
库存:
有库存

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制造商 :
Rochester Electronics, LLC
产品分类 :
逻辑 - 专业逻辑
Logic Type :
Scan Test Device with Inverting Buffers
Mounting Type :
Through Hole
Number of Bits :
8
Operating Temperature :
0°C ~ 70°C
Package / Case :
24-DIP (0.300", 7.62mm)
Product Status :
Obsolete
Supplier Device Package :
24-PDIP
Supply Voltage :
4.5V ~ 5.5V
数据列表
SN74BCT8240ANT

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